LEADER 00000nam  2200000 i 4500 
001    x320955205 
008    020219s1988    us a    r     101   eng d 
020    0892528842 
040    UZ.CPS 
245 00 Automated inspection and high speed vision architectures :
       |b[proceedings] : 3-4 november 1987, Cambridge, 
       Massachusetts /|cMichael J.W. Chen, Rolf-Juergen Ahlers, 
       chairs/editors ; sponsored [and] published by SPIE--The 
       International Society for Optical Engineering 
260    Bellingham, Washington :|bSPIE,|ccop. 1988 
300    vi, 274 p. :|bil. ;|c28 cm  
440  0 Proceedings of SPIE ;|vVol. 849 
650 04 Control de calidad|vCongresos 
650 04 Visión por ordenador|vCongresos 
700 1  Chen, Michael J.W.,|eed. lit. 
700 1  Ahlers, Rolf-Juergen,|eed. lit. 
710 2  SPIE-The International Society for Optical Engineering 
907 00 m|ca|dm|e0|flb|g020219|h0|i020219 
Ubicación Signatura Tipo de préstamo Estado Notas
 B.Hypatia-Depósito(Col.Elect./Com.)  EC-VISI 95    PRÉSTAMO LARGO  DISPONIBLE